VNA Tools training course and VNA expert day
VNA Tools is a free software developed by METAS for measurements with the Vector Network Analyzer (VNA). The software facilitates the tasks of evaluating measurement uncertainty in compliance with the ISO-GUM and justifying metrological traceability. The three day course provides a practical and hands-on lesson with this superior and versatile software.
Event Details
Conditions of participation
We can offer a significant discount for participants from academia. To qualify, we require a letter of support from the institution or proof of student status. The number of seats is limited – please ask.
Language of the event
English
Contact
METAS Secretariat
Federal Institute of Metrology METAS
Lindenweg 50
3003 Bern-Wabern
Prices
Per person | CHF 2,800, lunches and coffee breaks included. |
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The software is available for download at www.metas.ch/vnatools.
Course targets
The training has a focus on practical usage of the software. Participants bring a laptop to the course and will be guided in the use of VNA Tools through the different steps of a VNA measurement. This covers interaction with the VNA, data taking, VNA calibration, VNA error correction, data visualization, data export, evaluation of uncertainty contributions, uncertainty budget and more. The course however goes beyond a tutorial in software usage. It touches a wide range of conceptual aspects related to VNA Tools and relevant for the quality of VNA measurements in general, just to name a few.
- the powerful generic uncertainty engine METAS UncLib,
- the determination of best measurement capabilities,
- the role of connector imperfections in the definition of calibration standards and best measurement practice.
Free VNA expert day
Day 4: State of the art primary S-parameter traceability and how VNA Tools can support
Target audience
Engineers, scientists, technicians and students in metrology, calibration, research and production. Anyone who is required to perform accurate S-parameter measurements and to demonstrate metrological traceability.